Which diffraction technique is used with Transmission Electron Microscopy?

Selected area electron diffraction is a technique commonly used in conjunction with Transmission Electron Microscopy (TEM). This method allows for the analysis of the crystallographic structure of materials at a very small scale. By selecting a specific area of the sample, the diffraction patterns can provide valuable information regarding the orientation and phase of the crystalline materials present.

In the context of Transmission Electron Microscopy, this technique is critical as it enables researchers to determine the crystalline properties of thin samples that are typically needed for TEM analysis. The selected area diffraction patterns can help in identifying phases, measuring lattice parameters, and understanding defects within the crystal structure.

The other techniques listed are utilized in various microscopy and material characterization processes but do not directly complement the functionality of Transmission Electron Microscopy in the same way. Energy dispersive X-ray analysis, for instance, focuses on identifying elemental composition rather than crystallography. High-angle annular dark field imaging provides contrast based on atomic number but does not provide the same level of crystallographic detail as diffraction techniques. Fourier transform infrared spectroscopy is more aligned with organic materials and molecular structures, rather than the specifics of electron diffraction related to crystallography in TEM.